Material Analysis Laboratory (MAL)
Capabilities
- Environmental scanning electron microscope (SEM) with a focused ion beam (FIB) Energy dispersive spectroscopy (EDS), and Electron backscatter diffraction (EBSD)
- Digital radiography/computed tomography (DR/CT) system
- Digital and stereomicroscopes
- Metallographic sectioning, mounting, polishing, etching, and imaging
- Laser profilometer/confocal microscope
- White-light scanning microscope
- Laser induced breakdown spectroscopy (LIBS)
- X-ray fluorescence (XRF)
- Hardness testing, including Rockwell hardness, microhardness, and portable hardness testers
- X-Ray photoelectron spectrometer (XPS)
- Thermogravimetric analyzer (TGA) with gas chromatograph (GC) and infrared spectrometer (FTIR)
- Differential scanning calorimetry (DSC)
- Thermomechanical analyzer (TMA)
- Dynamic mechanical analyzer (DMA)
- Simultaneous thermal analyzer DSC/TGA (SDT)
- Electrical testing: Analog, Digital & mixed signal testing equipment; High-voltage facility power; High-frequency electrical & DC power system testing
- Thermal imaging cameras
Digital Radiography/Computer Tomography (DR/CT in MAL)
NASA/KSC
Optical inspection during data analysis
NASA/KSC
Dual beam field emission scanning electron microscope
NASA/KSC
